Electron Backscatter Diffraction in Materials Science
Publisher: Springer | 2000 | ISBN: 030646487X | Pages: 350 | PDF | 59,28 MB
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or electron channeling for local crystallographic information.
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